IEEE

Insulation Resistance and Tracking Index of Circuit Breaker According to the Accelerated Aging Test

Abstract: This study examined insulation resistance and tracking index characteristics through the accelerated aging test of low-voltage circuit breakers. The leakage current was found to be ...

MIT electronics researchers develop a new way to fabricate transistors on the backend of finished dies, to keep pushing the limit of chip densities ever higher

Traditional CMOS chips are fabricated by applying and then etching repeated layers of different materials, applied to a wafer ...
IEEE

A 4-Transistor Monolithic Solution to Highly Linear On-Chip Temperature Sensing in GaN Power Integrated Circuits

Abstract: We report the monolithic realization of on-chip temperature sensing design using four transistors (4T) in gallium nitride (GaN) technology. The temperature sensor consists of a voltage ...