Testing at the wafer level helps intercept and remove defective components early in the manufacturing process so that only fully operational chips are taken to the next step. Detecting defects at the ...

We came across a bullish thesis on Aehr Test Systems, Inc. (AEHR) on Ahead of the Curve’s Substack by Ashleigh Day. In this ...

Data cited in this release include polished silicon wafers, including those used as virgin test wafers, as well as epitaxial ...

FormFactor’s extensive experience in silicon photonics, including wafer and die-level probing, allows us to support our customers at every stage—from initial development to full-scale production.” “As ...

Full integration of FormFactor’s Velox™ probe station control and wafer-level measurement with Advantest’s V93000 test system. Wafer-level low-loss edge and surface coupling for photonic ...

Together, these capabilities significantly shorten the time for opto-electrical testing and provide accurate, reliable measurements. The platform now also facilitates optical measurements through ...

develops advanced test-interface solutions for wafer sort and final test; produces scanning electron microscopes essential to photomask manufacturing; and offers system-level test solutions and ...